《Journal Of Electronic Testing-theory And Applications》重点专注发布工程：电子与电气-工程技术领域的新研究，旨在促进和传播该领域相关的新技术和新知识。鼓励该领域研究者详细地发表他们的高质量实验研究和理论结果。该杂志创刊至今，在工程：电子与电气-工程技术领域，有较高影响力，对来稿文章质量要求较高，稿件投稿过审难度较大。欢迎广大同领域研究者投稿该杂志。
| CiteScore | SJR | SNIP | CiteScore排名 | |||
|---|---|---|---|---|---|---|
| 2 | 0.271 | 0.518 | 学科类别 | 分区 | 排名 | 百分位 |
|
大类：大类：Engineering
小类：小类：ElectricalandElectronicEngineering
|
Q3 | 495/797 | 37% | |||
| 按JIF指标学科分区 | 收录子集 | 分区 | 排名 | 百分位 |
|---|---|---|---|---|
| 学科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 278 / 352 | 21.2% |
| 按JCI指标学科分区 | 收录子集 | 分区 | 排名 | 百分位 |
|---|---|---|---|---|
| 学科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 293 / 354 | 17.37% |
文章名称
引用次数
Machine Learning for Hardware Security: Opportunities and Risks
10
Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video Encryption
6
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits
5
Test and Reliability in Approximate Computing
5
An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays
4
Impact of Aging on the Reliability of Delay PUFs
3
Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic Testing
3
Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions
3
A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip
3
The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular Automata
3
